The evolution of atomic scale topography by sputtering erosion
- 1 January 1993
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 20 (1) , 90-94
- https://doi.org/10.1002/sia.740200113
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Submicron-scale surface roughening induced by ion bombardmentPhysical Review Letters, 1991
- Growth and Erosion of Thin Solid FilmsScience, 1990
- The modelling of surface evolution during growth and erosionInternational Journal of Numerical Modelling: Electronic Networks, Devices and Fields, 1990
- The application of the Huygens principle to surface evolution in inhomogeneous, anisotropic and time-dependent systemsJournal of Physics D: Applied Physics, 1989
- A kinematic model of surface evolution during growth and erosion: Numerical analysisJournal of Vacuum Science & Technology A, 1989
- Analytic, geometric and computer techniques for the prediction of morphology evolution of solid surfaces from multiple processesJournal of Physics D: Applied Physics, 1987
- Simple model for etchingPhysical Review B, 1986
- Die Analyse monomolekularer FestkörperoberflÄchenschichten mit Hilfe der SekundÄrionenemissionThe European Physical Journal A, 1970
- Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline TargetsPhysical Review B, 1969
- Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline TargetsPhysical Review B, 1969