An Explicit Solution for the Scattering Parameters of a Linear Two-Port Measured with an Imperfect Test Set (Correspondence)
- 1 January 1971
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 19 (1) , 122-123
- https://doi.org/10.1109/tmtt.1971.1127466
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Measuring Frequency Characteristics of Linear Two-Port Networks AutomaticallyBell System Technical Journal, 1969