Measuring Frequency Characteristics of Linear Two-Port Networks Automatically
- 6 May 1969
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 48 (5) , 1313-1338
- https://doi.org/10.1002/j.1538-7305.1969.tb04270.x
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Skin-Effect Corrections in Immittance and Scattering Coefficient Standards Employing Precision Air-Dielectric Coaxial LinesIEEE Transactions on Instrumentation and Measurement, 1966
- Complete Linear Characterization of Transistors from Low Throug very High FrequenciesIRE Transactions on Instrumentation, 1957