Universal adsorption at the vapor-liquid interface near the consolute point
- 1 January 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 41 (2) , 885-890
- https://doi.org/10.1103/physreva.41.885
Abstract
The ellipticity of the vapor-liquid interface above mixtures of methylcyclohexane ( ) plus perfluoromethylcyclohexane ( ) has been measured near the consolute point =318.6 K. The data are consistent with a model of the interface that combines a short-ranged density-versus-height profile in the vapor phase with a much longer-ranged composition-versus-height profile in the liquid. The one-parameter model profile fits the data well for reduced temperatures t=(T-)/>7×. The model predicts a maximum ellipticity at t=7×, which occurs at t=2× in the experiment. The value of the free parameter produced by fitting the model to the data is consistent with results from two other simple mixtures and a mixture of a polymer and solvent. This experiment combines precision ellipsometry of the vapor-liquid interface with in situ measurements of refractive indices of the liquid phases, and it precisely locates the consolute point.
Keywords
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