Artifacts in transmission electron microscope images of artificially layered metallic superlattices
- 5 May 1986
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 48 (18) , 1202-1204
- https://doi.org/10.1063/1.96468
Abstract
Both uniform and irregular artificially layered superlattice structures can exhibit a variety of misleading image artifacts in transmission electron microscopy when the layer normal is not perpendicular to the beam direction. These include apparent ‘‘layer dislocations,’’ and the origins of these and other artifacts, as observed in Cu/NiPd superlattices, are discussed.Keywords
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