Connector stability test for small system connectors

4 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 342-357
https://doi.org/10.1109/holm.1990.113031

Abstract

An engineering study of connector performance using test procedures which incorporated current understanding of contact degradation modes is presented. Emphasis is placed on contact resistance stability during environmental aging under worst-case, simulated office conditions. Extensive studies on large sample sizes of commercial gold-plated connector systems shored that interface motion is a key element in any test methodology used to evaluate connector stability. This is analyzed in terms of the ability of each connector design to mechanically manage surface films and or wear debris to maintain metallic asperity contact. It is also determined that the evaluation of stability/reliability should be based on a distribution of contact resistance change limits over the range of 5 to 100 m Omega . This differs significantly from the more traditional approaches requiring that 100% of values are not to exceed a fixed limit. This approach represents a realistic balance between theory, practical measurement limitations, and practical hardware/field experience.

Keywords

This publication has 2 references indexed in Scilit:

Materials, environment, motion, and electrical contact failure mechanisms
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
Survey of Contact Fretting in Electrical Connectors
IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1985