Automated microwave measurements of microstrip ring resonators at low temperatures
- 1 June 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Applied Superconductivity
- Vol. 7 (2) , 1865-1868
- https://doi.org/10.1109/77.620948
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- The dielectric properties of yttria-stabilized zirconiaPublished by Elsevier ,2003
- Measurements of material and circuit properties using a microstrip ring-resonator circuit on zirconia at 77KPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1993
- Dielectric loss tangent of yttria stabilised zirconia at 5.6 GHz and 77 KElectronics Letters, 1992
- Relative permittivity and dielectric loss tangent of substrate materials for high-T c superconducting filmJournal of Superconductivity, 1991
- The processing and properties of high T/sub c/ thick filmsIEEE Transactions on Magnetics, 1991
- The effective microwave surface impedance of high T c thin filmsJournal of Applied Physics, 1990
- Accurate model for effective dielectric constant of microstrip with validity up to millimetre-wave frequenciesElectronics Letters, 1982
- Swept-frequency microwave Q-factor measurementProceedings of the Institution of Electrical Engineers, 1976
- Measurement techniques in microstripElectronics Letters, 1969
- The theory of the anomalous skin effect in metalsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1948