Double-tip scanning tunneling microscope for surface analysis
- 15 February 1995
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 51 (8) , 5502-5505
- https://doi.org/10.1103/physrevb.51.5502
Abstract
We explore the possibility of using a double-tip scanning tunneling microscope to probe the single-electron Green function of a sample surface, and describe a few important applications: (1) probing constant energy surfaces in k space by ballistic transport; (2) measuring scattering phase shifts of defects; (3) observing the transition from ballistic to diffusive transport to localization; and (4) measuring inelastic mean free paths.Keywords
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