Saturated output of a GeXXIII x-ray laser at 19.6 nm
- 1 December 1996
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 54 (6) , R4653-R4656
- https://doi.org/10.1103/physreva.54.r4653
Abstract
We report on measurements of the saturated single frequency output of a GeX X I I I x-ray laser on the J=0→1 transition at 19.6 nm from a refraction compensating double target driven by 150 J of energy from 75-ps Nd-glass laser pulses. The 19.6-nm line completely dominated the laser output. The output energy was measured to be 0.9 mJ in a beam of 6.6×30 divergence, corresponding to a conversion efficiency of 6×. © 1996 The American Physical Society.
Keywords
This publication has 13 references indexed in Scilit:
- Measurement ofLaser Imprint in a Thin Si Foil Using an X-Ray Laser BacklighterPhysical Review Letters, 1996
- Soft-x-ray lasing at 32.6 nm in Ne-like Ti ions driven by 40 J of energy from two 650-ps laser pulsesPhysical Review A, 1996
- Ne-like ion lasers in the extreme ultraviolet regionPhysical Review A, 1995
- Nearly Monochromatic Lasing at 182 Å in Neonlike SeleniumPhysical Review Letters, 1995
- Preliminary studies of radiation coupling between remote soft X-ray laser amplifiersApplied Physics B Laser and Optics, 1994
- Power measurements of a saturated yttrium x-ray laserOptics Letters, 1993
- Observation of high gain in Ne-like Ag lasersPhysical Review A, 1992
- Observation of gain-narrowing and saturation behavior in Se x-ray laser line profilesPhysical Review Letters, 1992
- Saturated and near-diffraction-limited operation of an XUV laser at 23.6 nmPhysical Review Letters, 1992
- Low-energy x-ray interaction coefficients: Photoabsorption, scattering, and reflectionAtomic Data and Nuclear Data Tables, 1982