REM Studies of Adsorption-Induced Phase Transitions and Faceting in the Si(111)-Au System
- 1 June 1998
- journal article
- Published by World Scientific Pub Co Pte Ltd in Surface Review and Letters
- Vol. 5 (3) , 653-663
- https://doi.org/10.1142/s0218625x98001018
Abstract
Initial stages of Au adsorption processes on Si(111)-(7 × 7) surfaces at ~780°C, a temperature range where the surface structure undergoes successive phase transitions [(7 × 7)–("1 × 1")–(5×2)–("1 × 1")], were observed in situ by reflection electron microscopy. All of the phase transitions are heterogeneous on the surface and start at surface atomic steps. During Au adsorption on Si(111)-(7 × 7), and subsequently on Si(111)-("1 × 1") surface with wide terraces, steps advance toward the step-down direction. At a Au coverage of ~0.3 ML, the 5 × 2 structure nucleates at step edges, and the nuclei expand both to the lower side terraces and to the higher side terraces. At this stage, an effect of current for heating the specimen was noted. From measurements of such movements of the steps and the domain boundaries, the density of Si atoms in the "1 × 1" phase is estimated to be 1.3–1.7 ML at a Au coverage of ~0.3 ML. Au adsorption on Si(111) surfaces with narrow terraces causes bunching of the steps. After nucleation of the 5 × 2 structure, the bunched steps become straight along the direction, and are transformed into the (335) facet planes at a Au coverage of 0.50 ML. It was found that the (335) facet planes are stabilized by adsorbed Au atoms. Destruction of the (335) facet is noted at a Au coverage of 0.73 ML.Keywords
This publication has 16 references indexed in Scilit:
- Scanning-tunneling-microscopy study of initial stages of Au adsorption on vicinal Si(111) surfacesPhysical Review B, 1996
- Gold-induced facetting of Si(111)Surface Science, 1995
- Evidence for the leading role of the stacking-fault triangle in the Si(111) 1×1→7×7 phase transitionPhysical Review B, 1995
- Deep-Level Transient Spectroscopy of Interface States in ZnO/PrCoOx/ZnO Thin-Film JunctionsJapanese Journal of Applied Physics, 1992
- Surface electromigration of Au on Si(001) studied by REMSurface Science, 1992
- Design features of an ultrahigh-vacuum electron microscope for REM-PEEM studies of surfacesUltramicroscopy, 1991
- Gold adsorption processes on Si(111)7 × 7 studied by in-situ reflection electron microscopySurface Science, 1990
- Dynamic observation of gold adsorption on Si(111)7×7 surface by high-resolution reflection electron microscopyUltramicroscopy, 1989
- Transformations on clean Si(111) stepped surface during sublimationSurface Science, 1989
- Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffractionSurface Science, 1985