Characterization of the native oxide of CuInSe2 using synchrotron radiation photoemission

1 October 1990

journal article
research article
Published by AIP Publishing in Applied Physics Letters

Vol. 57 (14) , 1428-1430
https://doi.org/10.1063/1.104122

Abstract

Synchrotron radiation soft x‐ray photoemission spectroscopy was used to investigate the native oxide of n‐type single‐crystal CuInSe₂. Photoemission measurements were acquired on the oxide surface before and after removal using sputter etching. Observed changes in the valence‐band electronic structure as well as changes in the In 4d and Se 3d core lines were correlated with the interface chemistry at the oxide/CuInSe₂ interface. These results show the native oxide to be composed of an In₂O₃ outer layer (no SeO₂) with an additional Cu₂Se interface layer.

Keywords

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