Effects of Atomic Arrangement at Tip Apex and Tip-Sample Distance on Atomic Force Microscopy Images: A Simulation Study
- 1 April 1996
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 35 (4R) , 2318-2325
- https://doi.org/10.1143/jjap.35.2318
Abstract
No abstract availableKeywords
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