Frequency dependence of cyclotron resonance in si inversion layers in the region of activated conductivity
- 1 August 1976
- journal article
- Published by Elsevier in Surface Science
- Vol. 58 (1) , 207-211
- https://doi.org/10.1016/0039-6028(76)90138-2
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
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- Cyclotron Resonance of Localized Electrons on a Si SurfacePhysical Review Letters, 1975
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- Properties of Semiconductor Surface Inversion Layers in the Electric Quantum LimitPhysical Review B, 1967