On-Chip Picosecond Time-Domain Measurements for VLSI and Interconnect Testing Using Photoconductors
- 1 February 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 20 (1) , 284-289
- https://doi.org/10.1109/jssc.1985.1052304
Abstract
No abstract availableKeywords
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