Optical Binding in Scanning Probe Microscopy

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Abstract
When a light beam impinges on two interacting objects of subwavelength size, a spatially confined electromagnetic field arises in the immediate proximity of the particles. In scanning probe microscopy, short-range forces induced by this electromagnetic near-field change the magnitude of the probe tip-substrate interaction. In this letter we analyse the physical process responsible for these forces in the context of the localized field susceptibility method.