Half-Unit Cell Growth of Bi–Sr–Ca–Cu–O Thin Films
- 1 October 1994
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 33 (10R) , 5697
- https://doi.org/10.1143/jjap.33.5697
Abstract
The growth units of superconducting Bi–Sr–Ca–Cu–O thin films were examined. The films were prepared on Y3Al5O12 (YAG) single-crystal substrates by metalorganic chemical vapor deposition (MOCVD). The growth process of the films at the initial stage was investigated by cross-sectional high-resolution transmission electron microscopy (HREM) and atomic force microscopy (AFM). We found evidence of half-unit cell growth, and the top layer of the half-unit was determined to be a Bi–O layer by angular-resolved measurement using X-ray photoelectron spectroscopy (XPS).Keywords
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