The thickness of the saturated helium film above and below the ?-point

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Abstract
Measurements of the thickness of the helium film coverning a vertical polished metal surface are reported for the height range 1 cm to 7 cm. At, 2.04°K the film thickness at a height of 1 cm is 3.20×10−6 cm and agrees within 2% of that determined by Ham and Jackson (1957). The thickness of the helium II film increases slightly with temperature. The results indicate that the thickness of the helium I film is essentially the same as that of the helium II film and confirms the theories of the film which are baused primnarily on van der Waals' forces of attraction. Under the experimental conditions the thickness of the helium I film was independent of temperature and practically independent of the position of the liquid level.

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