On the mechanism of diffusion-induced boundary migration
- 1 August 1981
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine A
- Vol. 44 (2) , 333-340
- https://doi.org/10.1080/01418618108239536
Abstract
A grain-boundary-dislocation mechanism for diffusion-induced boundary migration is proposed. It is suggested that point-defect emission from grain-boundary dislocations is necessary for the solution and transport of substitutional solutes. Grain-boundary migration occurs as a by-product of the emission of point defects, owing to the requirement that the dislocation remain in the grain-boundary plane.Keywords
This publication has 16 references indexed in Scilit:
- On the mechanisms of point-defect absorption by grain and twin boundariesPhilosophical Magazine A, 1980
- A model for stress-induced migration of tilt grain boundaries in crystals of NaCl structureActa Metallurgica, 1980
- Stress-induced absorption and emission of point defects by grain boundariesMetal Science, 1980
- On diffusional mass transport in polycrystals containing stationary or migrating grain boundariesScripta Metallurgica, 1979
- Diffusion induced grain boundary migrationScripta Metallurgica, 1979
- Chemically induced grain boundary migrationActa Metallurgica, 1978
- Periodic grain boundary structures in aluminium. II. A geometrical method for analysing periodic grain boundary structure and some related transmission electron microscope observationsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1977
- Interface reaction and a special form of grain boundary diffusion in the Cr-W systemActa Metallurgica, 1972
- On measurements of self‐diffusion rates along dislocations in F.C.C. MetalsPhysica Status Solidi (b), 1970
- On interface-reaction control of Nabarro-Herring creep and sinteringScripta Metallurgica, 1969