Abstract
The external coupling efficiency in planar organic light-emitting devices is modeled based on a quantum mechanical microvavity theory and measured by examining both the far-field emission pattern and the edge emission of light trapped in the glass substrate. The external coupling efficiency is dependent upon the thickness of the indium–tin–oxide layer and the refractive index of the substrate. The coupling efficiency ranges from ∼24% to ∼52%, but in general it is much larger than the 18.9% expected from classical ray optics.