X-ray microanalysis near an absorption edge using synchrotron radiation: How to obtain quantitative results
- 1 March 1982
- journal article
- Published by Elsevier in Optics Communications
- Vol. 41 (1) , 6-12
- https://doi.org/10.1016/0030-4018(82)90201-2
Abstract
No abstract availableKeywords
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