High-resolution scanning transmission electron microscope at Johns Hopkins
- 1 April 1979
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 50 (4) , 403-410
- https://doi.org/10.1063/1.1135840
Abstract
The scanning transmission electron microscope constructed at Johns Hopkins follows the general layout of the first instrument at the University of Chicago. It is currently operating at 50 kV with a resolution of about 3 Å. Its detector scheme consists of scintillation crystals coupled to photomultipliers in such a way as to eliminate introduction of unnecessary statistical noise. A unique alignment scheme utilizes the spherical aberration of the objective lens.Keywords
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