Difference in microstructure between PZT thin films on Pt/Ti and those on Pt
- 1 March 1995
- journal article
- research article
- Published by Taylor & Francis in Integrated Ferroelectrics
- Vol. 8 (1-2) , 89-98
- https://doi.org/10.1080/10584589508012303
Abstract
PZT thin films were synthesized by sol-gel on a Pt/Ti double layer bottom electrode or on a Pt single layer bottom electrode to investigate the bottom electrode dependence of PZT film structure. On Pt/Ti, oriented perovskite grains with 50–100 nm lateral size were densely packed. On Pt, large perovskite grains (2−3 μm) were surrounded by fine pyrochlore grains (about 5 nm), and no certain orientation was observed. TEM and EDX analyses suggested that a fraction of Ti in the Pt/Ti layer diffused along Pt grain boundaries up to the Pt surface and was oxidized during the PZT annealing process. A model for the crystallization of sol-gel derived PZT was proposed, in which TiOx particles at the Pt surface act as nucleation sites for PZT crystallization. This model well explained the experimental results.Keywords
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