Mev helium erosion of thin sulphur films
- 1 September 1986
- journal article
- research article
- Published by Taylor & Francis in Radiation Effects
- Vol. 99 (1-4) , 293-299
- https://doi.org/10.1080/00337578608209634
Abstract
Experimental results on erosion of thin sulphur layers at various temperatures (77–300 K) by MeV He beams are presented. We find a yield of Y=10.5 S-atoms/ion for samples at low temperatures (77 K) and Y∼102 to 103 for samples at RT (300 K). We interpret the results at low temperatures as “true” erosion, i.e. related to the energy transfer from incoming ion to electronic excitations in the target atoms. The enormous yield measured at room temperature as well as those previously published for thick sulphur targets,1,2 can be ascribed to beam-induced heating of the bombarded sulphur.Keywords
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