Thin film analysis by low energy proton induced X-ray emission
- 1 August 1984
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 4 (3) , 408-411
- https://doi.org/10.1016/0168-583x(84)90589-5
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- A method of determining the depth of impurities by proton-induced X-raysNuclear Instruments and Methods, 1977
- Kinetics of phase formation in Au—A1 thin filmsPhilosophical Magazine, 1975
- Full-range solution for the measurement of thin-film surface densities with proton-excited x raysJournal of Applied Physics, 1972
- Production of Characteristic X Rays by Low-Energy ProtonsPhysical Review B, 1962