Characterization of epitaxial sputtered NixCo1−xO thin films on α-Al2O3 using transmission electron microscopy
- 31 December 1991
- journal article
- Published by Elsevier in Scripta Metallurgica et Materialia
- Vol. 25 (12) , 2633-2638
- https://doi.org/10.1016/0956-716x(91)90130-s
Abstract
No abstract availableKeywords
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