Realization of a scale of absolute spectral response using the National Institute of Standards and Technology high-accuracy cryogenic radiometer
- 1 August 1996
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 35 (22) , 4392-4403
- https://doi.org/10.1364/ao.35.004392
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 22 references indexed in Scilit:
- Present State of the Comparison between Radiometric Scales Based on Three Primary StandardsMetrologia, 1993
- Characterization of Photodiodes in the UV and Visible Spectral Region Based on Cryogenic RadiometryMetrologia, 1993
- Comparison of the NIST high Accuracy Cryogenic Radiometer and the NIST scale of Detector Spectral ResponseMetrologia, 1993
- Optical functions of silicon determined by two-channel polarization modulation ellipsometryOptical Materials, 1992
- Effects of Humidity and Cleaning on the Sensitivity of Si PhotodiodesMetrologia, 1991
- Optical constants for silicon at 300 and 10 K determined from 1.64 to 4.73 eV by ellipsometryJournal of Applied Physics, 1982
- Temperature dependence of the optical properties of siliconJournal of Applied Physics, 1979
- Optical Constants of Epitaxial Silicon in the Region 1–3.3 eVPhysica Scripta, 1975
- Influence of Oxide Layers on the Determination of the Optical Properties of SiliconJournal of Applied Physics, 1972
- Interspecimen Comparison of the Refractive Index of Fused Silica*,†Journal of the Optical Society of America, 1965