Testing the adhesion of thin films using real-time holographic interferometry: a simple method
- 1 September 1978
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 17 (17) , 2670
- https://doi.org/10.1364/ao.17.002670
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 2 references indexed in Scilit:
- A simple method for the measurement of stress in evaporated thin films by real-time holographic interferometryThin Solid Films, 1978
- Rapid in situ processing for real-time holographic interferometryJournal of Physics E: Scientific Instruments, 1973