Microstructure defects in YBCO thin films: A TEM study to discuss their influence on device properties
- 1 March 1995
- journal article
- Published by Elsevier in Physica C: Superconductivity and its Applications
- Vol. 243 (3-4) , 281-293
- https://doi.org/10.1016/0921-4534(95)00011-9
Abstract
No abstract availableKeywords
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