Lead zirconate titanate cantilever for noncontact atomic force microscopy
- 1 February 1999
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 140 (3-4) , 428-431
- https://doi.org/10.1016/s0169-4332(98)00567-4
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- Atom-Resolved Image of theSurface by Noncontact Atomic Force MicroscopyPhysical Review Letters, 1997
- Frequency modulation detection high vacuum scanning force microscope with a self-oscillating piezoelectric cantileverJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1997
- Simultaneous imaging of Si(111) 7×7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact modeJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1996
- Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force MicroscopeJapanese Journal of Applied Physics, 1995
- Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force MicroscopyScience, 1995
- A Self-Sensing Piezoelectric Actuator for Collocated ControlJournal of Intelligent Material Systems and Structures, 1992
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991
- Microfabrication of cantilever styli for the atomic force microscopeJournal of Vacuum Science & Technology A, 1990
- Atomic Force MicroscopePhysical Review Letters, 1986
- 7 × 7 Reconstruction on Si(111) Resolved in Real SpacePhysical Review Letters, 1983