Frequency and ac field scaling of the nonlinear ac susceptibility of aHgBa2CaCu2O6+δthin film

Abstract
We confirm a recently proposed scaling relation for the nonlinear ac susceptibility response of type-II superconductors by high-precision measurements on a c-axis oriented HgBa2CaCu2O6+δ thin film. From measurements in different ac field and frequency combinations, given by the scaling relation, the flux creep exponent n(T,H) of the superconducting film can be determined. At T=100K and in the field range studied, n(T,H) is found to vary with the dc bias field as Hdc0.18.