A computerized system for determining secondary ion energy spectra
- 3 December 1979
- journal article
- Published by Elsevier in Analytica Chimica Acta
- Vol. 112 (1) , 1-9
- https://doi.org/10.1016/s0003-2670(01)93025-9
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Detector discrimination in SIMS: Ion-to-electron converter yield factors for positive ionsInternational Journal of Mass Spectrometry and Ion Physics, 1978
- Angular distribution measurements of sputtered atoms with characteristic X-ray emissionNuclear Instruments and Methods, 1976
- Secondary ion emission from polycrystalline molybdenum: Energy and angular distributionsNuclear Instruments and Methods, 1976
- Ion MicroscopyAnalytical Chemistry, 1975
- Surface and thin film analysisAnalytical Chemistry, 1975
- Secondary−ion mass spectrometry and its use in depth profilingJournal of Vacuum Science and Technology, 1975
- Secondary-ion emission during bombardment of copper and aluminium single crystals with alkali ionsInternational Journal of Mass Spectrometry and Ion Physics, 1974
- Distributions énergétique et angulaire de l'émission ionique secondaire. III. Distribution angulaire et rendements ioniquesJournal de Physique, 1968