On the interpretation of image spectrograms in some metrological applications
- 1 February 1982
- journal article
- Published by Elsevier in Optics & Laser Technology
- Vol. 14 (1) , 33-36
- https://doi.org/10.1016/0030-3992(82)90065-2
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Interferometric studies of the dimensional variations of silicone elastomersOptics & Laser Technology, 1979
- Image Spectrograms Of Three-Dimensional Objects: Metrological ApplicationsPublished by SPIE-Intl Soc Optical Eng ,1978
- Spectrogrammes-images et Anamorphoses en Optique Spatio-temporelleOptica Acta: International Journal of Optics, 1977
- Measurement of the rms roughness, autocovariance function and other statistical properties of optical surfaces using a FECO scanning interferometerApplied Optics, 1976