Schottky diode fabrication for electroreflectance measurements
- 1 June 1975
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 46 (6) , 735-738
- https://doi.org/10.1063/1.1134299
Abstract
A method is described for fabricating and evaluating metal–semiconductor (Schottky diode) samples for electroreflectance measurements over a wide spectral range. This technique has been used successfully on a variety of semiconductors. The completed samples have been cycled from 300 to 6 K maintaining very stable characteristics and allowing excellent reproducibility in electroreflectance data.Keywords
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