Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source
- 27 April 2006
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 252 (19) , 6547-6549
- https://doi.org/10.1016/j.apsusc.2006.02.098
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Cluster primary ion bombardment of organic materialsApplied Surface Science, 2004
- Secondary ion mass spectrometry using cluster primary ion beamsApplied Surface Science, 2003
- Development and experimental application of a gold liquid metal ion sourceApplied Surface Science, 2002
- Analysis of polymer surfaces by SIMS. Part 5. The effects of primary ion mass and energy on secondary ion relative intensitiesInternational Journal of Mass Spectrometry and Ion Processes, 1985