A high precision photoelectric ellipsometer
- 31 August 1969
- journal article
- Published by Elsevier in Surface Science
- Vol. 16, 137-146
- https://doi.org/10.1016/0039-6028(69)90012-0
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Sources of error in ellipsometrySurface Science, 1969
- A Quarter-Wave Compensator with a Sensitive Half-Shadow DeviceJournal of the Optical Society of America, 1954
- The Calibration of Quarter-Wave Plates*Journal of the Optical Society of America, 1952
- Improved Glan-Foucault PrismJournal of Scientific Instruments, 1948