Capacitance: relationships and measurements (for multiple conductors in VLSI packages and PWB)

4 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 163-168 vol.1
https://doi.org/10.1109/ectc.1990.122183

Abstract

Three descriptions of capacitances for multiple conductors over a ground are discussed: the lumped-element capacitance, the two-terminal capacitance, and Maxwell's capacitance. Equations that completely interrelate the different descriptions of capacitance are presented. Experimental evidence supporting the two-terminal measurement technique is presented. An example how the measurement can be applied to the VLSI package is given. It is also shown how networks of cross-coupled resistors can be measured.

Keywords

This publication has 3 references indexed in Scilit:

Electrical Modeling of Interconnections in Multilayer Packaging Structures
IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1987
A Resistance Problem
SIAM Review, 1984
Calculation of Coefficients of Capacitance of Multiconductor Transmission Lines in the Presence of a Dielectric Interface
IEEE Transactions on Microwave Theory and Techniques, 1970