Collection efficiency and crosstalk in closely spaced photodiode arrays
- 1 August 1986
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 60 (3) , 1091-1096
- https://doi.org/10.1063/1.337403
Abstract
Lateral diffusion of carriers in closely spaced photodiode arrays leads to image degradation. The effect is analyzed for backside illuminated arrays in the limiting cases of very small and very large optical absorption lengths. It is concluded that closely spaced two-dimensional arrays for thermal imaging applications will require the use of semiconductors whose thicknesses are less than the diameters of the photodiodes.This publication has 4 references indexed in Scilit:
- Peripheral electron-beam induced current response of a shallow p-n junctionJournal of Applied Physics, 1984
- Steady-state photocarrier collection in silicon imaging devicesIEEE Transactions on Electron Devices, 1983
- MTF modelling of backside-illuminated PV detector arraysInfrared Physics, 1981
- Theory of life time measurements with the scanning electron microscope: Steady stateSolid-State Electronics, 1976