CRRES Microelectronics Test Package (MEP)
- 1 April 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 40 (2) , 228-232
- https://doi.org/10.1109/23.212346
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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- CRRES microelectronic test chip orbital data. IIIEEE Transactions on Nuclear Science, 1992
- A comparison between /sup 60/Co ground tests and CRRES space flight dataIEEE Transactions on Nuclear Science, 1992
- Comparison of SEU rate prediction techniquesIEEE Transactions on Nuclear Science, 1992
- CRRES dosimetry results and comparisons using the space radiation dosimeter and p-channel MOS dosimetersIEEE Transactions on Nuclear Science, 1992
- CRRES microelectronic test chipIEEE Transactions on Nuclear Science, 1991
- A double-peaked inner radiation belt: cause and effect as seen on CRRESIEEE Transactions on Nuclear Science, 1991
- SEU flight data from the CRRES MEPIEEE Transactions on Nuclear Science, 1991
- Test of SEU algorithms against preliminary CRRES satellite dataIEEE Transactions on Nuclear Science, 1991
- Prediction of error rates in dose-imprinted memories on board CRRES by two different methodsIEEE Transactions on Nuclear Science, 1991