A method of alignment for convergent beam diffraction in TEM mode for a JEM-100C electron microscope
- 1 January 1982
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 7 (4) , 343-350
- https://doi.org/10.1016/0304-3991(82)90259-5
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Combining convergent-beam diffraction with high resolution imagingUltramicroscopy, 1981
- The co-precipitation of vacancies and carbon atoms in quenched platinumJournal of Nuclear Materials, 1979