Frequency response of bipolar junction transistors after electron-beam irradiations

This publication has 4 references indexed in Scilit:

• Electron beam damage of advanced silicon bipolar transistors and circuits
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Self-aligned bipolar transistors for high-performance and low-power-delay VLSI
  IEEE Transactions on Electron Devices, 1981
• Function testing of bipolar ICs and LSIs with the stroboscopic scanning electron microscope
  IEEE Journal of Solid-State Circuits, 1980
• Comparison of gold, platinum, and electron irradiation for controlling lifetime in power rectifiers
  IEEE Transactions on Electron Devices, 1977