Apparatus to measure thin-film capacitors in the frequency range 0.0075-700Hz
- 1 July 1973
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 6 (7) , 619-622
- https://doi.org/10.1088/0022-3735/6/7/011
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Instability in vacuum deposited silicon oxideIEEE Transactions on Electron Devices, 1967
- An investigation of instability and charge motion in metal-silicon oxide-silicon structuresIEEE Transactions on Electron Devices, 1966
- Dispersion and Absorption in Dielectrics I. Alternating Current CharacteristicsThe Journal of Chemical Physics, 1941
- Electrical Properties of Solids. VIII. Dipole Moments in Polyvinyl Chloride-Diphenyl Systems*Journal of the American Chemical Society, 1941