Electrical characterization of amorphous silicon nanoparticles
- 15 August 2004
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 96 (4) , 2204-2209
- https://doi.org/10.1063/1.1763991
Abstract
Electrical contact to amorphous silicon nanoparticles was established with a method that self aligns the contacts to the particles. Charge transport characteristics were studied as a function of temperature and voltage. The conduction in these devices was not limited by the metal∕semiconductor barrier; rather it was limited by charge trapping in the particles themselves. The data are well fit to theory. It was shown that the space charge limited current (SCLC) model fits the medium voltage range (2–6V), while space charged limited current with Frenkel–Poole effect fits the relatively high voltage range (5–8V). Using a model for space charge limited current in the presence of an exponential distribution of traps, we estimate that the trap density is 2×1019cm−3. Based on SCLC enhanced with Frenkel–Poole effect, the activation energy measured at high voltage was determined to 0.44eV. This agrees well with the medium voltage activation energy, 0.41eV.This publication has 19 references indexed in Scilit:
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