Physical limitation on drain voltage of power PM HEMT
- 1 July 1997
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 37 (7) , 1137-1141
- https://doi.org/10.1016/s0026-2714(96)00275-2
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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