Experimental Procedures in X-Ray Diffraction Topography
- 1 January 1966
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 10, 134-152
- https://doi.org/10.1154/s0376030800004341
Abstract
The quality and interpretation of diffraction topographic images are strongly dependent on. the detailed laboratory techniques that are used in making them. In this paper practical instructions are given for the preparation of Berg-Barrett and Lang topographs. It is hoped that these suggestions will enable the novice in the field of X-ray topography to produce high quality images and to interpret them with a minimum of learning time. The topics treated include adjustment of the critical conditions for attaining highest resolution, choice of radiation and the specific hkl planes to be used, conditions limiting the size of the image, cause and avoidance of image distortion, choice of photographic emulsions, plate processing for best contrast and resolution, photomicrographs of the original image, and plate preservation.Keywords
This publication has 4 references indexed in Scilit:
- Measuring Techniques of Parallel-Beam-Diffraction MicrographyPublished by Springer Nature ,1967
- Study of Defect Structures in BeO Single Crystals by X-Ray Diffraction TopographyJournal of Applied Physics, 1965
- Dynamical Diffraction of X Rays by Perfect CrystalsReviews of Modern Physics, 1964
- Studies of Individual Dislocations in Crystals by X-Ray Diffraction MicroradiographyJournal of Applied Physics, 1959