Ar L-shell ionization by electrons and light ions: determination of X-ray emission cross sections and mean fluorescence yields for charge-state distributions
- 21 August 1975
- journal article
- Published by IOP Publishing in Journal of Physics B: Atomic and Molecular Physics
- Vol. 8 (12) , 2079-2108
- https://doi.org/10.1088/0022-3700/8/12/020
Abstract
The absolute cross sections for ArL2.3 X-ray emission have been measured for 0.25-14 keV electrons, 30-500 keV protons, 30-150 keV H2+, 30-800 keV He+, and 600-2000 keV alpha particles, incident on argon gas. Experimental problems associated with absolute measurements of the X-ray cross sections, particularly the detection efficiency, are discussed. In order to calculate mean fluorescence yields the X-ray data have been compared with available L2.3 Auger-electron-ejection cross sections; the accuracy of the absolute fluorescence yields obtained is about 37%. An extensive analysis is presented on the outer-shell charged-state distributions of the Ar L ions formed, considering the fraction of normal Auger transitions, the different types of excitation mechanisms and some empirical models.Keywords
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