X-ray reflectivity of a Langmuir monolayer on water
- 1 January 1987
- journal article
- Published by EDP Sciences in Revue de Physique Appliquée
- Vol. 22 (8) , 775-778
- https://doi.org/10.1051/rphysap:01987002208077500
Abstract
We built a special Langmuir through allowing the use of X-ray reflectivity. Using the device we studied for the first time the density profile of a Langmuir monolayer directly on water. This experiment opens new prospects in particular to measure the roughness of solid films on water subphaseKeywords
This publication has 6 references indexed in Scilit:
- X-ray optics in Langmuir-Blodgett filmsJournal de Physique, 1987
- X-ray method for the structural investigation of thin organic filmsJournal de Physique, 1986
- Surface Roughness of Water Measured by X-Ray ReflectivityPhysical Review Letters, 1985
- Dispositif d'étude des surfaces solides ou liquides par réflexion spéculaire des rayons XRevue de Physique Appliquée, 1985
- Composition and transfer mechanism of Langmuir-Blodgett multilayers of stearatesThin Solid Films, 1980
- Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicatesRevue de Physique Appliquée, 1980