Analysis of short channel effects in poly-Si thin film transistors: A new method
- 30 September 1992
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 19 (1-4) , 183-186
- https://doi.org/10.1016/0167-9317(92)90418-q
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Avalanche-induced effects in polysilicon thin-film transistorsIEEE Electron Device Letters, 1991
- A Unified Circuit Model for the Polysilicon Thin Film TransistorJapanese Journal of Applied Physics, 1991