Amorphous Bimetal Interface as a Testing Medium for the Spatial Resolution of EDX Microanalysis
- 16 April 1996
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 154 (2) , K1-K4
- https://doi.org/10.1002/pssa.2211540234
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
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