Comparator Method for Optical Lifetime Measurements on Semiconductors
- 1 March 1957
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 28 (3) , 202
- https://doi.org/10.1063/1.1746486
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Measurement of Carrier Lifetimes in Germanium and SiliconJournal of Applied Physics, 1955