Correction of the Self-Absorption Effect in Fluorescence X-Ray Absorption Fine Structure
- 1 June 1993
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 32 (6R) , 2899-2902
- https://doi.org/10.1143/jjap.32.2899
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Full correction of the self-absorption in soft-fluorescence extended x-ray-absorption fine structurePhysical Review B, 1992
- Fluorescence x-ray absorption fine structure measurements using a synchrotron radiation x-ray microprobeReview of Scientific Instruments, 1991
- Structural parameter determination in fluorescence EXAFS of concentrated samplesReview of Scientific Instruments, 1989
- Accurate X-ray absorption spectra obtained from concentrated bulk samples by fluorescence detectionPhysics Letters A, 1989
- Surface extended x-ray-absorption fine-structure spectroscopy measurement using the evanescent-wave effect of fluorescent x raysPhysical Review B, 1989
- Flourescence detection of surface exafsPhysics Letters A, 1984
- Fluorescence detection of exafs: Sensitivity enhancement for dilute species and thin filmsSolid State Communications, 1977